The influence of a thermal annealing on electric conduction of silicon monocrystals doped by nickel has been studied. Also, an analysis of the morphology of impurity microinclusions under the influence of heat treatment was carried out by the method of electron probe microanalysis.
| Mualliflar | Зайнабидинов, С.З., Тургунов, Н.А. |
|---|---|
| Jurnal | O‘zbekiston fizika jurnali |
| Nashr sanasi | 2018-05-21 |
| Jild | 20 |
| Son | 3 |
| Betlar | 153-157 |
| Til | Rus |
| DOI | 10.52304/.v20i3.85 |
DOI: 10.52304/.v20i3.85 · Maqolaning asl sahifasi
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