THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER
| Mualliflar | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, Ш.А. Юлдашев |
|---|---|
| Jurnal | (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали |
| Nashriyot | Яримўтказгичлар физикаси ва микроэлектроника илмий- тадқиқот институти |
| ISSN | 2181-9947, 2181-1652 |
| Nashr sanasi | 2021-12-30 |
| Jild | 3 |
| Son | 6 |
| Betlar | 45-50 |
| Til | Ingliz |
| Ilmiy soha | Fizika-matematika |
| DOI | 10.37681/2181-1652-019-x-2021-6-10 |
| Indeksga qo‘shilgan | 2026-09-02 |
DOI: 10.37681/2181-1652-019-x-2021-6-10 · Maqolaning asl sahifasi
| APA | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, & Ш.А. Юлдашев (2021). THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER. (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 45-50. https://doi.org/10.37681/2181-1652-019-x-2021-6-10 |
|---|---|
| GOST (OAK) | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, Ш.А. Юлдашев THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER // (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали. – 2021. – T. 3, № 6. – P. 45-50. – DOI: 10.37681/2181-1652-019-x-2021-6-10. |
| MLA | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, and Ш.А. Юлдашев. “THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER.” (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 45-50, 2021. https://doi.org/10.37681/2181-1652-019-x-2021-6-10 |
| Chicago | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, and Ш.А. Юлдашев. “THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER.” (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 45-50 (2021). https://doi.org/10.37681/2181-1652-019-x-2021-6-10 |
| Harvard | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, and Ш.А. Юлдашев (2021) ‘THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER’, (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 45-50. https://doi.org/10.37681/2181-1652-019-x-2021-6-10 |
| BibTeX | @article{sriofphysicsofsemiconductorsandmicroelectronicsatnuuznamedaftermirzoulugbek2021,
title = {THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER},
author = {SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK and К.Э. Онаркулов and Ш.А. Юлдашев},
journal = {(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали},
year = {2021},
volume = {3},
number = {6},
pages = {45-50},
doi = {10.37681/2181-1652-019-x-2021-6-10},
url = {https://doi.org/10.37681/2181-1652-019-x-2021-6-10}
} |
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