SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, О.Х. Кулдашов, И.О. Холмирзаев, Ш.Э. Муродов, С.Ш. Рашидов
OPTICAL GAS ANALYZER OF EXPLOSIVE CONCENTRATIONS OF HYDROCARBONS IN THE ATMOSPHERE
- HIGH-RESOLUTION X-RAY DIFFRACTION INVESTIGATIONS OF FILMS OF SOLID SOLUTIONS (GaAs)1-x-y(Ge2)x(ZnSe)y
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, С.З. Зайнабидинов, А.Й. Бобоев, Д.П. Абдурахимов · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
HIGH-RESOLUTION X-RAY DIFFRACTION INVESTIGATIONS OF FILMS OF SOLID SOLUTIONS (GaAs)1-x-y(Ge2)x(ZnSe)y
- INVESTIGATION OF THE INFLUENCE OF Si-SiO2 TRANSITION LAYERS ON THE CAPACITY-VOLTAGE CHARACTERISTICS IN THREE-LAYER SILICON STRUCTURES
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Kh.S. Daliev, Ф.А. Сапаров · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
INVESTIGATION OF THE INFLUENCE OF Si-SiO2 TRANSITION LAYERS ON THE CAPACITY-VOLTAGE CHARACTERISTICS IN THREE-LAYER SILICON STRUCTURES
- RADIATIONS FOR THE LIFETIME OF CHARGE CARRIERS IN SILICON DOPED WITH COPPER AND IRIDIUM
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М.Ю. Ташметов, Sh. A. Makhmudov, А.Р. Рафиков, A. A. Sulaimonov, М.Ф. Жураева, Ж.С. Мирзара · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
RADIATIONS FOR THE LIFETIME OF CHARGE CARRIERS IN SILICON DOPED WITH COPPER AND IRIDIUM
- STUDY OF THE ELEMENTAL COMPOSITION AND STRUCTURE OF HIGHER MANGANESE SILICIDES
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Н.Ф. Зикриллаев, Т. Комилов, А.Ж. Хусанов, К.К Курбоналиев, М.М. Шоабдурахимова · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
STUDY OF THE ELEMENTAL COMPOSITION AND STRUCTURE OF HIGHER MANGANESE SILICIDES
- INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, З.Т. Азаматов, М.А. Йулдошев, Н.Н. Базарбаев · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS
- DIGITAL INFRARED HUMIDITY METER OF RAW COTTON IN BUNTS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Х.С. Далиев, Golibzhon Kuldashov · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
DIGITAL INFRARED HUMIDITY METER OF RAW COTTON IN BUNTS
- STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, Я.Ж. Жаббарова · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS
- STUDY AND ANALYSIS OF ELECTRICAL PARAMETERS OF SILICON PHOTOELECTRIC BATTERIES FROM VARIOUS TYPES OF SOLAR CELLS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М.Н. Турсунов, Х. Сабиров, Ш.Н. Абилфайзиев, Б.А. Юлдошов · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
STUDY AND ANALYSIS OF ELECTRICAL PARAMETERS OF SILICON PHOTOELECTRIC BATTERIES FROM VARIOUS TYPES OF SOLAR CELLS
- A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Р. Икрамов, Kh.A. Muminov, М. Нуриддинов, K. I. Abdullaev, Bobur Q. Sultonov · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
- THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, К.Э. Онаркулов, Ш.А. Юлдашев · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER