STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS
| Mualliflar | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, Я.Ж. Жаббарова |
|---|---|
| Jurnal | (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали |
| Nashriyot | Яримўтказгичлар физикаси ва микроэлектроника илмий- тадқиқот институти |
| ISSN | 2181-9947, 2181-1652 |
| Nashr sanasi | 2021-12-30 |
| Jild | 3 |
| Son | 6 |
| Betlar | 25-30 |
| Til | Ingliz |
| Ilmiy soha | Fizika-matematika |
| DOI | 10.37681/2181-1652-019-x-2021-6-6 |
| Indeksga qo‘shilgan | 2026-09-02 |
DOI: 10.37681/2181-1652-019-x-2021-6-6 · Maqolaning asl sahifasi
| APA | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, & Я.Ж. Жаббарова (2021). STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS. (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 25-30. https://doi.org/10.37681/2181-1652-019-x-2021-6-6 |
|---|---|
| GOST (OAK) | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK va b. STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS // (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали. – 2021. – T. 3, № 6. – P. 25-30. – DOI: 10.37681/2181-1652-019-x-2021-6-6. |
| MLA | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, and Я.Ж. Жаббарова. “STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS.” (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 25-30, 2021. https://doi.org/10.37681/2181-1652-019-x-2021-6-6 |
| Chicago | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, and Я.Ж. Жаббарова. “STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS.” (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 25-30 (2021). https://doi.org/10.37681/2181-1652-019-x-2021-6-6 |
| Harvard | SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, and Я.Ж. Жаббарова (2021) ‘STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS’, (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали, 3(6), 25-30. https://doi.org/10.37681/2181-1652-019-x-2021-6-6 |
| BibTeX | @article{sriofphysicsofsemiconductorsandmicroelectronicsatnuuznamedaftermirzoulugbek2021,
title = {STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS},
author = {SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK and М. K. Kаrimov and S.Kh. Khakimov and Я.Ж. Жаббарова},
journal = {(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали},
year = {2021},
volume = {3},
number = {6},
pages = {25-30},
doi = {10.37681/2181-1652-019-x-2021-6-6},
url = {https://doi.org/10.37681/2181-1652-019-x-2021-6-6}
} |
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