SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Б.Э. Эгамбердиев, У.Б. Шаропов, Н. Норкулов
FORMATION OF DEFECTS ON THE SURFACE OF LiF CRYSTALS DURING BOMBARDING WITH CHLORINE IONS
- INVESTIGATION OF SILICON DIFFUSIONLY ALLOYED WITH ZINC AND SELENIUM ATOMS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, О. Турсунов, Н. Зикриллаев · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
INVESTIGATION OF SILICON DIFFUSIONLY ALLOYED WITH ZINC AND SELENIUM ATOMS
- THIN FILMS OF SOLID SOLUTION CdXZn1XS COMPOUND GROWN IN A HYDROGEN FLOW
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Ш.Б. Утамурадова, С.А. Музафарова, А.С. Ачилов, К.М. Файзуллаев · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
THIN FILMS OF SOLID SOLUTION CdXZn1XS COMPOUND GROWN IN A HYDROGEN FLOW
- A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Р. Икрамов, Kh.A. Muminov, М. Нуриддинов, K. I. Abdullaev, Bobur Q. Sultonov · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
- STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М. K. Kаrimov, S.Kh. Khakimov, Я.Ж. Жаббарова · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS
- INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, З.Т. Азаматов, М.А. Йулдошев, Н.Н. Базарбаев · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS
- RADIATIONS FOR THE LIFETIME OF CHARGE CARRIERS IN SILICON DOPED WITH COPPER AND IRIDIUM
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, М.Ю. Ташметов, Sh. A. Makhmudov, А.Р. Рафиков, A. A. Sulaimonov, М.Ф. Жураева, Ж.С. Мирзара · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
RADIATIONS FOR THE LIFETIME OF CHARGE CARRIERS IN SILICON DOPED WITH COPPER AND IRIDIUM
- HIGH-RESOLUTION X-RAY DIFFRACTION INVESTIGATIONS OF FILMS OF SOLID SOLUTIONS (GaAs)1-x-y(Ge2)x(ZnSe)y
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, С.З. Зайнабидинов, А.Й. Бобоев, Д.П. Абдурахимов · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
HIGH-RESOLUTION X-RAY DIFFRACTION INVESTIGATIONS OF FILMS OF SOLID SOLUTIONS (GaAs)1-x-y(Ge2)x(ZnSe)y
- OPTICAL GAS ANALYZER OF EXPLOSIVE CONCENTRATIONS OF HYDROCARBONS IN THE ATMOSPHERE
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, О.Х. Кулдашов, И.О. Холмирзаев, Ш.Э. Муродов, С.Ш. Рашидов · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-12-30
OPTICAL GAS ANALYZER OF EXPLOSIVE CONCENTRATIONS OF HYDROCARBONS IN THE ATMOSPHERE
- INVESTIGATION OF THE INFLUENCE OF Si-SiO2 TRANSITION LAYERS ON THE CAPACITY-VOLTAGE CHARACTERISTICS IN THREE-LAYER SILICON STRUCTURES
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Kh.S. Daliev, Ф.А. Сапаров · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
INVESTIGATION OF THE INFLUENCE OF Si-SiO2 TRANSITION LAYERS ON THE CAPACITY-VOLTAGE CHARACTERISTICS IN THREE-LAYER SILICON STRUCTURES
- STUDY OF THE ELEMENTAL COMPOSITION AND STRUCTURE OF HIGHER MANGANESE SILICIDES
SRI OF PHYSICS OF SEMICONDUCTORS AND MICROELECTRONICS AT NUUZ named after MIRZO ULUGBEK, Н.Ф. Зикриллаев, Т. Комилов, А.Ж. Хусанов, К.К Курбоналиев, М.М. Шоабдурахимова · (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-10-30
STUDY OF THE ELEMENTAL COMPOSITION AND STRUCTURE OF HIGHER MANGANESE SILICIDES