Structures of SinOm + Clusters Sprayed by Ionic Bombardment

Максимов, С.Е., Ашуров, Х.Б., Адилов, М.М., Коваленко, С.Ф., Тукфатуллин, О.Ф., Хожиев, Ш.Т.

O‘zbekiston fizika jurnali · 2019-yil

Annotatsiya

SinOm+ cluster ions sputtered from Si surface by Xe+ under O2 flooding have been investigated using double focusing ion microanalyzer with reverse geometry. Proposed structural schemes of the cluster cations have been presented, the comparison has been made with the structures of neutrals and anion clusters of silicon oxide.

Maqola ma’lumotlari
MualliflarМаксимов, С.Е., Ашуров, Х.Б., Адилов, М.М., Коваленко, С.Ф., Тукфатуллин, О.Ф., Хожиев, Ш.Т.
JurnalO‘zbekiston fizika jurnali
Nashr sanasi2019-10-21
Jild21
Son5
Betlar283-292
TilRus
DOI10.52304/.v21i5.131

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