The effects of thermal and laser annealing on the structure and composition of Na+-implantedGe(111) were investigated using Auger electron spectroscopy and secondary ion mass spectrometry.Ion implantation was performed with Na+ ions at an energy of E0 = 1 keV and a doseof D = 10¹6 cm−². This process resulted in complete amorphization of the Ge surface layers andthe formation of various Na–Ge compounds within the ion-doped region, containing 8–10 at.%of unbound Na and Ge atoms. Upon annealing at T = 900 K, a NaGe-type film forms, thoughthe doped layer remains amorphous. At T = 1100 K, a uniform single-crystal NaGe2 film ofapproximately 30–35 Å thickness is observed. Laser annealing at an energy density of W ≈ 1.2J·cm−² produces a single-crystal cubic NaGe film with a thickness of 35–40 Å, while increasingW ≈1.5 J·cm−² results in the formation of a NaGe2 film of similar thickness. Additionally,for samples implanted with Na+ ions at E0 ≥ 3 keV, heating at T ≤ 700 K or laser annealing atW ≤ 1.5 J·cm−² leads to increased sodium concentration near the surface and a shift of the sodiumdepth profile CNa peak toward the surface.
| Mualliflar | Исаханов, З.А., Умирзаков, Б.Е., Ташмухамедова, Д.А., Абраева, С.Т., Худайбердиев, И.Ф., Касимов, Б.Ш. |
|---|---|
| Jurnal | O‘zbekiston fizika jurnali |
| Nashriyot | Ўзбекистон Республикаси Фанлар академияси |
| ISSN | 1025-8817, 2181-077X |
| Nashr sanasi | 2025-10-31 |
| Jild | 27 |
| Son | 3 |
| Til | Ingliz |
| Ilmiy soha | Fizika-matematika |
| DOI | 10.52304/.v27i3.594 |
| Indeksga qo‘shilgan | 2026-08-26 |
DOI: 10.52304/.v27i3.594 · Maqolaning asl sahifasi
ионная имплантация, распыление, состав, прогрев, лазерный отжиг, оже-электронная спектроскопия, ion implantation, sputtering, composition, thermal annealing, laser annealing, Auger electron spectroscopy
| APA | Исаханов, З.А., Умирзаков, Б.Е., Ташмухамедова, Д.А., Абраева, С.Т., Худайбердиев, И.Ф., & Касимов, Б.Ш. (2025). The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers. O‘zbekiston fizika jurnali, 27(3). https://doi.org/10.52304/.v27i3.594 |
|---|---|
| GOST (OAK) | Исаханов, З.А. va b. The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers // O‘zbekiston fizika jurnali. – 2025. – T. 27, № 3. – DOI: 10.52304/.v27i3.594. |
| MLA | Исаханов, З.А., Умирзаков, Б.Е., Ташмухамедова, Д.А., Абраева, С.Т., Худайбердиев, И.Ф., and Касимов, Б.Ш. “The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers.” O‘zbekiston fizika jurnali, 27(3), 2025. https://doi.org/10.52304/.v27i3.594 |
| Chicago | Исаханов, З.А., Умирзаков, Б.Е., Ташмухамедова, Д.А., Абраева, С.Т., Худайбердиев, И.Ф., and Касимов, Б.Ш. “The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers.” O‘zbekiston fizika jurnali, 27(3) (2025). https://doi.org/10.52304/.v27i3.594 |
| Harvard | Исаханов, З.А., Умирзаков, Б.Е., Ташмухамедова, Д.А., Абраева, С.Т., Худайбердиев, И.Ф., and Касимов, Б.Ш (2025) ‘The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers’, O‘zbekiston fizika jurnali, 27(3). https://doi.org/10.52304/.v27i3.594 |
| BibTeX | @article{article2025,
title = {The Effect of Thermal and Laser Annealing on the Composition and Structure of Ion-Dopped Ge Layers},
author = {Исаханов, З.А. and Умирзаков, Б.Е. and Ташмухамедова, Д.А. and Абраева, С.Т. and Худайбердиев, И.Ф. and Касимов, Б.Ш.},
journal = {O‘zbekiston fizika jurnali},
year = {2025},
volume = {27},
number = {3},
doi = {10.52304/.v27i3.594},
url = {https://doi.org/10.52304/.v27i3.594}
} |
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