ON THE INFLUENCE OF DISPROSION ON THE PROCESSES OF RADIATION DEFECT FORMATION IN SILICON

Далиев, Х.С., Утамурадова, Ш.Б., Далиев, Ш.Х., Дехканов, М.Ш., Норкулов, Ш.Б.

O‘zbekiston fizika jurnali · 2018-yil

Annotatsiya

In the paper, the DLTS method is used to study the effect of dysprosium atoms on the efficiency of radiation defects formation in n-Si irradiated with γ-quanta 60Co. It is shown that formation of A-centers dominates in silicon with oxygen, and in oxygen-free silicon E-centers dominate. It was found that the presence of Dy in the volume of silicon leads to a slowdown in the process of radiation defect formation. The concentration of A-centers and E-centers in the n-Si samples 2-4 times less than the control samples.

Maqola ma’lumotlari
MualliflarДалиев, Х.С., Утамурадова, Ш.Б., Далиев, Ш.Х., Дехканов, М.Ш., Норкулов, Ш.Б.
JurnalO‘zbekiston fizika jurnali
Nashr sanasi2018-03-21
Jild20
Son2
Betlar131-133
TilRus
DOI10.52304/.v20i2.39

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