In this paper, experimental results obtained by the method of spectroscopy of the characteristic energy loss of electrons are presented to study the composition and electronic structure of Cu(100) with silicon surface nanofilms of various thickness (dSi≈50−400 Å). It has been shown that the density of the valence electron states in thick and free thin films differ noticeably from each other.
| Mualliflar | Касимов, И.О., Умирзаков, Б.Е., Исаханов, З.А., Рузибаева, М.К., Курбанов, Р. |
|---|---|
| Jurnal | O‘zbekiston fizika jurnali |
| Nashr sanasi | 2019-06-21 |
| Jild | 21 |
| Son | 3 |
| Betlar | 158-160 |
| Til | Rus |
| DOI | 10.52304/.v21i3.75 |
DOI: 10.52304/.v21i3.75 · Maqolaning asl sahifasi
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