STUDY OF THE SPECTRA OF CHARACTERISTIC ENERGY LOSSES OF FREE Si-Cu NANOFILM SYSTEMS

Касимов, И.О., Умирзаков, Б.Е., Исаханов, З.А., Рузибаева, М.К., Курбанов, Р.

O‘zbekiston fizika jurnali · 2019-yil

Annotatsiya

In this paper, experimental results obtained by the method of spectroscopy of the characteristic energy loss of electrons are presented to study the composition and electronic structure of Cu(100) with silicon surface nanofilms of various thickness (dSi≈50−400 Å). It has been shown that the density of the valence electron states in thick and free thin films differ noticeably from each other.

Maqola ma’lumotlari
MualliflarКасимов, И.О., Умирзаков, Б.Е., Исаханов, З.А., Рузибаева, М.К., Курбанов, Р.
JurnalO‘zbekiston fizika jurnali
Nashr sanasi2019-06-21
Jild21
Son3
Betlar158-160
TilRus
DOI10.52304/.v21i3.75

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