DEVICE FOR STUDYING TENZE SENSITIVITY IN PHOTOSENSITIVE SEMICONDUCTOR FILMS

Branch o f the Federal State Budgetary Educational Institution o f Higher Education ", Kh.S. Daliev, MEI", in Tashkent, Uzbekistan, M.K. Onarkulov, S.M. Otajonov

(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-yil

Annotatsiya

A device has been developed for studying strain sensitivity in photosensitive wide- gap semiconductor thin films. The device allows the study o f strain sensitivity in photosensitive wide- gap semiconductor thin films when illuminated with natural and monochromatic light within the deformation range from -210-3 to 210-3 rel. At the same time, this device makes it possible to deform the same film repeatedly without destroying it

Maqola ma’lumotlari
MualliflarBranch o f the Federal State Budgetary Educational Institution o f Higher Education ", Kh.S. Daliev, MEI", in Tashkent, Uzbekistan, M.K. Onarkulov, S.M. Otajonov
Jurnal(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали
Nashr sanasi2021-02-28
Jild3
Son1
Betlar31-35
Tilen
DOI10.37681/2181-1652-019-x-2021-1-5

(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали jurnalidan boshqa maqolalar

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