A device has been developed for studying strain sensitivity in photosensitive wide- gap semiconductor thin films. The device allows the study o f strain sensitivity in photosensitive wide- gap semiconductor thin films when illuminated with natural and monochromatic light within the deformation range from -210-3 to 210-3 rel. At the same time, this device makes it possible to deform the same film repeatedly without destroying it
| Mualliflar | Branch o f the Federal State Budgetary Educational Institution o f Higher Education ", Kh.S. Daliev, MEI", in Tashkent, Uzbekistan, M.K. Onarkulov, S.M. Otajonov |
|---|---|
| Jurnal | (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали |
| Nashr sanasi | 2021-02-28 |
| Jild | 3 |
| Son | 1 |
| Betlar | 31-35 |
| Til | en |
| DOI | 10.37681/2181-1652-019-x-2021-1-5 |
DOI: 10.37681/2181-1652-019-x-2021-1-5 · Maqolaning asl sahifasi
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