Results o f research o f influence o f single mono- and multilayered antireflection coverings on optical characteristics of silicon are discussed. Results received by program system "PVlighthouse" with the appendix “STGraphs”, developed by authors on a basis “C#9.0”. Spectral curve dependences o f an indicator o f absorption o f light on a thickness o f an antireflection covering and base silicon are resulted. Using o f multilayered antireflection coverings aren’t sufficient for keeping o f absorption level o f light at small thickness o f silicon. It is expedient to use surfaces texturing wich promote more effective lengthening o f a beams way o f in a thickness o f silicon.
| Mualliflar | S.S. Nasriddinov, M.A. Mujdinova |
|---|---|
| Jurnal | (2019) Яримўтказгичлар физикаси ва микроэлектроника журнали |
| Nashr sanasi | 2021-02-28 |
| Jild | 3 |
| Son | 1 |
| Betlar | 69-72 |
| Til | en |
| DOI | 10.37681/2181-1652-019-x-2021-1-11 |
DOI: 10.37681/2181-1652-019-x-2021-1-11 · Maqolaning asl sahifasi
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(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали — barcha maqolalar