INFLUENCE OF YTTERBIUM IMPURITY ON THE GENERATION CHARACTERISTICS OF MDP STRUCTURES

Sharifa B. Utamuradova, Sh.Kh. Daliyev, Mansur B. Bekmuratov

(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали · 2021-yil

Annotatsiya

The influence o f ytterbium atoms on the electrophysical properties o f silicon MIS- structures is investigated by means o f CC-DLTS and high-frequency volt- faradic characteristics. It is shown that the presence o f ytterbium atoms in the volume o f the silicon substrate leads to a decrease in the density o f surface states o f MIS - structures. It is found that the presence o f Yb atoms in the substrate does not lead to noticeable changes in the density distribution o f surface states o f Nss over the width o f the band gap Eg

Maqola ma’lumotlari
MualliflarSharifa B. Utamuradova, Sh.Kh. Daliyev, Mansur B. Bekmuratov
Jurnal(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали
Nashr sanasi2021-02-28
Jild3
Son1
Betlar16-19
Tilen
DOI10.37681/2181-1652-019-x-2021-1-2

(2019) Яримўтказгичлар физикаси ва микроэлектроника журнали jurnalidan boshqa maqolalar

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