Influence of disorder in the crystalline structure of ion-implanted silicon on the density of states of valent electrons

Нормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., Рысбаев, А.С.

O‘zbekiston fizika jurnali · 2019-yil

Annotatsiya

In the paper, the effect of implantation of Na+ ions with different fluences on the density of states of Si(111) valence electrons has been studied by the methods of spectroscopy of elastically scattered electrons (SESE) and spectroscopy of characteristic energy loss (SCEL). It is shown that the experimentally observed shift of the maxima of the density of states of Si valence electrons is explained theoretically using the Keldysh diagram technique for an electron in a random field of impurity atoms by the strong disordering of the crystal structure of the ion-implanted Si(111) surface region.

Maqola ma’lumotlari
MualliflarНормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., Рысбаев, А.С.
JurnalO‘zbekiston fizika jurnali
NashriyotЎзбекистон Республикаси Фанлар академияси
ISSN1025-8817, 2181-077X
Nashr sanasi2019-08-21
Jild21
Son4
Betlar229-234
TilIngliz
Ilmiy sohaFizika-matematika
DOI10.52304/.v21i4.110
Indeksga qo‘shilgan2026-08-26

Ilmiy soha

Iqtibos keltirish

APAНормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., & Рысбаев, А.С. (2019). INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS. O‘zbekiston fizika jurnali, 21(4), 229-234. https://doi.org/10.52304/.v21i4.110
GOST (OAK)Нормурадов, М.Т. va b. INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS // O‘zbekiston fizika jurnali. – 2019. – T. 21, № 4. – P. 229-234. – DOI: 10.52304/.v21i4.110.
MLAНормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., and Рысбаев, А.С. “INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS.” O‘zbekiston fizika jurnali, 21(4), 229-234, 2019. https://doi.org/10.52304/.v21i4.110
ChicagoНормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., and Рысбаев, А.С. “INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS.” O‘zbekiston fizika jurnali, 21(4), 229-234 (2019). https://doi.org/10.52304/.v21i4.110
HarvardНормурадов, М.Т., Нормуродов, Д.А., Хужаниёзов, Ж.Б., and Рысбаев, А.С (2019) ‘INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS’, O‘zbekiston fizika jurnali, 21(4), 229-234. https://doi.org/10.52304/.v21i4.110
BibTeX
@article{article2019,
  title = {INFLUENCE OF DISORDER IN THE CRYSTALLINE STRUCTURE OF ION-IMPLANTED SILICON ON THE DENSITY OF STATES OF VALENT ELECTRONS},
  author = {Нормурадов, М.Т. and Нормуродов, Д.А. and Хужаниёзов, Ж.Б. and Рысбаев, А.С.},
  journal = {O‘zbekiston fizika jurnali},
  year = {2019},
  volume = {21},
  number = {4},
  pages = {229-234},
  doi = {10.52304/.v21i4.110},
  url = {https://doi.org/10.52304/.v21i4.110}
}

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