Comparative analysis of reference and no-reference quality metrics for SENTINEL-2 multispectral images based on quality criteria under controlled distortion conditions

Makhmadiyorov, Fakhriddin

Techscience.uz - техника фанлари долзарб масалалри · 2026-yil

Annotatsiya

Eight full-reference and no-reference image quality metrics were compared on 150 Sentinel-2 Level-2A patches under twelve controlled distortions. Mean spectral angle missed sparse impulsive damage, pooled inter-metric correlations diverged sharply from within-family ones, and BRISQUE and NIQE did not detect striping. An empirical metric-selection guide is proposed.

Maqola ma’lumotlari
MualliflarMakhmadiyorov, Fakhriddin
JurnalTechscience.uz - техника фанлари долзарб масалалри
NashriyotЖиззах политехника институти
ISSN3030-3702, 3030-3702
Nashr sanasi2026-10-12
Jild4
Son10
Betlar36-47
TilIngliz
Ilmiy sohaTexnika
DOI10.47390/ts-v4i10y2026n04
Indeksga qo‘shilgan2026-10-13

Kalit so‘zlar

image quality assessment, multispectral imagery, Sentinel-2, BigEarthNet, full-reference metrics, no-reference metrics, spectral angle mapper, ERGAS, BRISQUE, NIQE., tasvir sifatini baholash, multispektral tasvirlar, Sentinel-2, BigEarthNet, etalonli metrikalar, etalonsiz metrikalar, spektral burchak (SAM), ERGAS, BRISQUE, NIQE.

Ilmiy soha

Iqtibos keltirish

APAMakhmadiyorov, Fakhriddin (2026). COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS. Techscience.uz - техника фанлари долзарб масалалри, 4(10), 36-47. https://doi.org/10.47390/ts-v4i10y2026n04
GOST (OAK)Makhmadiyorov, Fakhriddin COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS // Techscience.uz - техника фанлари долзарб масалалри. – 2026. – T. 4, № 10. – P. 36-47. – DOI: 10.47390/ts-v4i10y2026n04.
MLAMakhmadiyorov, Fakhriddin. “COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS.” Techscience.uz - техника фанлари долзарб масалалри, 4(10), 36-47, 2026. https://doi.org/10.47390/ts-v4i10y2026n04
ChicagoMakhmadiyorov, Fakhriddin. “COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS.” Techscience.uz - техника фанлари долзарб масалалри, 4(10), 36-47 (2026). https://doi.org/10.47390/ts-v4i10y2026n04
HarvardMakhmadiyorov, Fakhriddin (2026) ‘COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS’, Techscience.uz - техника фанлари долзарб масалалри, 4(10), 36-47. https://doi.org/10.47390/ts-v4i10y2026n04
BibTeX
@article{makhmadiyorovfakhriddin2026,
  title = {COMPARATIVE ANALYSIS OF REFERENCE AND NO-REFERENCE QUALITY METRICS FOR SENTINEL-2 MULTISPECTRAL IMAGES BASED ON QUALITY CRITERIA UNDER CONTROLLED DISTORTION CONDITIONS},
  author = {Makhmadiyorov, Fakhriddin},
  journal = {Techscience.uz - техника фанлари долзарб масалалри},
  year = {2026},
  volume = {4},
  number = {10},
  pages = {36-47},
  doi = {10.47390/ts-v4i10y2026n04},
  url = {https://doi.org/10.47390/ts-v4i10y2026n04}
}

Boshqa maqola uchun iqtibos tayyorlash

Techscience.uz - техника фанлари долзарб масалалри jurnalidan boshqa maqolalar

Techscience.uz - техника фанлари долзарб масалалри — barcha maqolalar · 2026-yil arxivi

Texnika sohasidagi boshqa maqolalar

Texnika sohasidagi OAK jurnallari