KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH

Maxmudov, Sh.A., Jurayeva, M.F., Jalelov, M.A., Odilova, N.J.

Ilim ha’m ja’miyet · 2024-yil

Annotatsiya

In the article, single-crystal silicon having a perfect structure with a lattice parameter of 0,54292 nm and subcrystallites with a size of 94 nm was studied and determined the formation of low-dimensional defects consisting with the participation of oxygen in silicon grown by the Czochralski method.

Maqola ma’lumotlari
MualliflarMaxmudov, Sh.A., Jurayeva, M.F., Jalelov, M.A., Odilova, N.J.
JurnalIlim ha’m ja’miyet
Nashr sanasi2024-10-29
Son5-1
Betlar26-27
Tiluz_Latn

Kalit so‘zlar

monokristall, kremniy, mikronuqsonlar, kislorod konsentratsiyasi, rentgenografiya, bir xilmaslik, монокристалл, кремнии, микродефекты, концентрация кислорода, рентгенограмма, неоднородность, monocrystal, silicon, microdefects, concentration, oxygen, radiograph, heterogeneity

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