Raman spectroscopic analysis of tungsten silicide (WSI2) phase formation and lattice stress in p-type silicon.

Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev

Research Focus · 2025-yil

Annotatsiya

In this study, the effect of tungsten (W) incorporation on the compositional and structural properties of p-type single-crystal silicon (p-Si) samples via high-temperature (1573 K, 5 hours) thermal diffusion was investigated. The properties of the samples were analyzed using Raman scattering spectroscopy. Raman spectroscopy analysis confirmed a decrease in the intensity of the main silicon LO peak in the p-Si<W> sample, as well as the appearance of new, sharp peaks at frequencies of ~244 cm⁻¹ and ~429 cm⁻¹. These changes indicate the formation of a new stable phase – tungsten silicide (WSi2) – on the silicon surface. Furthermore, the shift of the 2TA peak center to a higher frequency (~319 cm⁻¹) indicated the emergence of strong compressive mechanical stresses in the lattice.

Maqola ma’lumotlari
MualliflarSh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev
JurnalResearch Focus
NashriyotВетеринария ИТИ ва “Илм-фан ва инновациялар академияси” МЧЖ
ISSN2181-3833
Nashr sanasi2025-12-05
Jild4
Son11
Betlar16-24
TilIngliz
Ilmiy sohaVeterinariya
DOI10.66073/researchfocus.v4i11.1824
Indeksga qo‘shilgan2026-09-08

DOI: 10.66073/researchfocus.v4i11.1824 · Maqolaning asl sahifasi

Kalit so‘zlar

монокристаллический кремний (p-Si), вольфрам (W), термическая диффузия, Рамановская спектроскопия, удельное сопротивление, силицид вольфрама (WSi2), фононные полосы, single-crystal silicon (p-Si), tungsten (W), thermal diffusion, Raman spectroscopy, resistivity, tungsten silicide (WSi2), phonon bands (TA, LA, 2TO)., monokristall kremniy (p-Si), volfram (W), termik diffuziya, Raman spektroskopiyasi, solishtirma qarshilik, volfram silitsidi (WSi2), fonon zonalari (TA, LA, 2TO).

Ilmiy soha

Veterinariya

Iqtibos keltirish

APASh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, & Y.Z. Mardiyev (2025). RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON.. Research Focus, 4(11), 16-24. https://doi.org/10.66073/researchfocus.v4i11.1824
GOST (OAK)Sh.B. Utamuradova va b. RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON. // Research Focus. – 2025. – T. 4, № 11. – P. 16-24. – DOI: 10.66073/researchfocus.v4i11.1824.
MLASh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, and Y.Z. Mardiyev. “RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON..” Research Focus, 4(11), 16-24, 2025. https://doi.org/10.66073/researchfocus.v4i11.1824
ChicagoSh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, and Y.Z. Mardiyev. “RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON..” Research Focus, 4(11), 16-24 (2025). https://doi.org/10.66073/researchfocus.v4i11.1824
HarvardSh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, Y.Z. Mardiyev, Ш.Б. Утамурадова, Ш.Х. Далиев, Дж.Дж. Хамдамов, Й.З. Мардиев, Sh.B. Utamuradova, Sh.Kh. Daliev, J.J. Khamdamov, and Y.Z. Mardiyev (2025) ‘RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON.’, Research Focus, 4(11), 16-24. https://doi.org/10.66073/researchfocus.v4i11.1824
BibTeX
@article{shbutamuradova2025,
  title = {RAMAN SPECTROSCOPIC ANALYSIS OF TUNGSTEN SILICIDE (WSI2) PHASE FORMATION AND LATTICE STRESS IN P-TYPE SILICON.},
  author = {Sh.B. Utamuradova and Sh.Kh. Daliev and J.J. Khamdamov and Y.Z. Mardiyev and Ш.Б. Утамурадова and Ш.Х. Далиев and Дж.Дж. Хамдамов and Й.З. Мардиев and Sh.B. Utamuradova and Sh.Kh. Daliev and J.J. Khamdamov and Y.Z. Mardiyev},
  journal = {Research Focus},
  year = {2025},
  volume = {4},
  number = {11},
  pages = {16-24},
  doi = {10.66073/researchfocus.v4i11.1824},
  url = {https://doi.org/10.66073/researchfocus.v4i11.1824}
}

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